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Imec Integrates CCD, CMOS Technology to Improve Performance of CMOS Imagers

Nanoelectronics research center develops embedded CCD in CMOS TDI image sensor for space applications

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By: DAVID SAVASTANO

Contributing Editor, Coatings World and Ink World, Coatings World and Ink World Magazine


Imec presented at this week’s “CMOS Image Sensors for High Performance Applications” workshop in Toulouse, France, a prototype of a high-performance, time-delay-integration (TDI) image sensor. The image sensor is based on imec’s proprietary embedded charge-coupled device (CCD) in CMOS technology. Imec developed and fabricated the sensor for the French Space Agency, CNES, which plans to utilize the technology for space-based earth observation.

The prototype image sensor combines a light-sensitive, CCD-based TDI pixel array with peripheral CMOS readout electronics. By integrating CCD with CMOS technology, imec combined the best of both worlds. The CCD pixel structure delivers low-noise TDI performance in the charge domain, while CMOS technology enables low-power, on-chip integration of fast and complex circuitry readouts.

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